검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Development of certified reference materials of ion-implanted dopants in silicon for calibration of secondary ion mass spectrometers Simons DS, Downing RG, Lamaze GP, Lindstrom RM, Greenberg RR, Paul RL, Schiller SB, Guthrie WF Journal of Vacuum Science & Technology B, 25(4), 1365, 2007 |
| 2 |
Standard Reference Materials for Particle-Size Analysis of Ceramic Powders by Gravity Sedimentation Lum LS, Malghan SG, Schiller SB Powder Technology, 87(3), 233, 1996 |