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| No. | Article |
|---|---|
| 1 |
Comparisons between intrinsic bonding defects in d(0) transition metal oxide such as HfO2, and impurity atom defects in d(0) complex oxides such as GdScO3 Lucovsky G, Chung KB, Miotti L, Bastos KP, Amado C, Schlom D Solid-State Electronics, 53(12), 1273, 2009 |