검색결과 : 18건
| No. | Article |
|---|---|
| 1 |
Physical vapor transport growth of bulk Al1-xScxN single crystals Dittmar A, Wollweber J, Schmidbauer M, Klimm D, Hartmann C, Bickermann M Journal of Crystal Growth, 500, 74, 2018 |
| 2 |
Structural properties of Si-doped beta-Ga2O3 layers grown by MOVPE Gogova D, Wagner G, Baldini M, Schmidbauer M, Irmscher K, Schewski R, Galazka Z, Albrecht M, Fornari R Journal of Crystal Growth, 401, 665, 2014 |
| 3 |
Strained ferroelectric NaNbO3 thin films: Impact of pulsed laser deposition growth conditions on structural properties Sellmann J, Schwarzkopf J, Kwasniewski A, Schmidbauer M, Braun D, Duk A Thin Solid Films, 570, 107, 2014 |
| 4 |
Impact of the crystallographic structure of epitaxially grown strained sodium-bismuth-titanate thin films on local piezo- and ferroelectric properties Duk A, Schwarzkopf J, Kwasniewski A, Schmidbauer M, Fornari R Materials Research Bulletin, 47(8), 2056, 2012 |
| 5 |
Influence of Na on the structure of Bi4Ti3O12 films deposited by liquid-delivery spin MOCVD Schwarzkopf J, Dirsyte R, Devi A, Kwasniewski A, Schmidbauer M, Wagner G, Michling M, Schmeisser D, Fornari R Thin Solid Films, 519(17), 5754, 2011 |
| 6 |
Impact of epitaxial strain on the ferromagnetic transition temperature of SrRuO3 thin films Dirsyte R, Schwarzkopf J, Schmidbauer M, Wagner G, Irmscher K, Bin Anooz S, Fornari R Thin Solid Films, 519(19), 6264, 2011 |
| 7 |
Growth of epitaxial sodium-bismuth-titanate films by metal-organic chemical vapor phase deposition Schwarzkopf J, Schmidbauer M, Duk A, Kwasniewski A, Bin Anooz S, Wagner G, Devi A, Fornari R Thin Solid Films, 520(1), 239, 2011 |
| 8 |
Depositions of SrRuO3 thin films on oxide substrates with liquid-delivery spin MOCVD Schwarzkopf J, Dirsyte R, Devi A, Schmidbauer M, Wagner G, Fornari R Thin Solid Films, 518(16), 4675, 2010 |
| 9 |
Structural investigations of homoepitaxial Si films grown at low temperature by pulsed magnetron sputtering on Si(111) substrates Fenske F, Schulze S, Hietschold M, Schmidbauer M Thin Solid Films, 516(15), 4777, 2008 |
| 10 |
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space Holy V, Mundboth K, Mokuta C, Metzger TH, Stangl J, Bauer G, Boeck T, Schmidbauer M Thin Solid Films, 516(22), 8022, 2008 |