검색결과 : 21건
No. | Article |
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1 |
Irradiation-induced deep levels in silicon for power device tailoring Siemieniec R, Niedernostheide FJ, Schulze HJ, Sudkamp W, Kellner-Werdehausen U, Lutz J Journal of the Electrochemical Society, 153(2), G108, 2006 |
2 |
Rupture of wetting films caused by nanobubbles Stockelhuber KW, Radoev B, Wenger A, Schulze HJ Langmuir, 20(1), 164, 2004 |
3 |
Analysis of radiation-induced defects and performance conditioning in high-power devices Niedernostheide FJ, Schmitt M, Schulze HJ, Kellner-Werdehausen U, Frohnmeyer A, Wachutka G Journal of the Electrochemical Society, 150(1), G15, 2003 |
4 |
Effect of ionic surfactants on the dimple relaxation in wetting films Tsekov R, Letocart P, Evstatieva E, Schulze HJ Langmuir, 18(15), 5799, 2002 |
5 |
First experimental proof of the nonexistence of long-range hydrophobic attraction forces in thin wetting films Stockelhuber KW, Schulze HJ, Wenger A Chemical Engineering & Technology, 24(6), 624, 2001 |
6 |
Prediction of van der Waals interaction in bubble-particle attachment in flotation Nguyen AV, Evans GM, Schulze HJ International Journal of Mineral Processing, 61(3), 155, 2001 |
7 |
Carrier lifetime analysis by photoconductance decay and free carrier absorption measurements Schulze HJ, Frohnmeyer A, Niedernostheide FJ, Hille F, Tutto P, Pavelka T, Wachutka G Journal of the Electrochemical Society, 148(11), G655, 2001 |
8 |
First experimental proof of the non-existence of long-range hydrophobic attractions in thin wetting films Stockelhuber KW, Schulze HJ, Wenger A Chemie Ingenieur Technik, 72(10), 1216, 2000 |
9 |
Analytical tools for the characterization of power devices Schulze HJ, Frohnmeyer A, Niedernostheide FJ, Simmnacher B, Kolbesen BO, Tutto P, Pavelka T, Wachutka G Journal of the Electrochemical Society, 147(10), 3879, 2000 |
10 |
Dimple relaxation in wetting films Tsekov R, Letocart P, Schulze HJ Langmuir, 16(21), 8206, 2000 |