화학공학소재연구정보센터
검색결과 : 21건
No. Article
1 Irradiation-induced deep levels in silicon for power device tailoring
Siemieniec R, Niedernostheide FJ, Schulze HJ, Sudkamp W, Kellner-Werdehausen U, Lutz J
Journal of the Electrochemical Society, 153(2), G108, 2006
2 Rupture of wetting films caused by nanobubbles
Stockelhuber KW, Radoev B, Wenger A, Schulze HJ
Langmuir, 20(1), 164, 2004
3 Analysis of radiation-induced defects and performance conditioning in high-power devices
Niedernostheide FJ, Schmitt M, Schulze HJ, Kellner-Werdehausen U, Frohnmeyer A, Wachutka G
Journal of the Electrochemical Society, 150(1), G15, 2003
4 Effect of ionic surfactants on the dimple relaxation in wetting films
Tsekov R, Letocart P, Evstatieva E, Schulze HJ
Langmuir, 18(15), 5799, 2002
5 First experimental proof of the nonexistence of long-range hydrophobic attraction forces in thin wetting films
Stockelhuber KW, Schulze HJ, Wenger A
Chemical Engineering & Technology, 24(6), 624, 2001
6 Prediction of van der Waals interaction in bubble-particle attachment in flotation
Nguyen AV, Evans GM, Schulze HJ
International Journal of Mineral Processing, 61(3), 155, 2001
7 Carrier lifetime analysis by photoconductance decay and free carrier absorption measurements
Schulze HJ, Frohnmeyer A, Niedernostheide FJ, Hille F, Tutto P, Pavelka T, Wachutka G
Journal of the Electrochemical Society, 148(11), G655, 2001
8 First experimental proof of the non-existence of long-range hydrophobic attractions in thin wetting films
Stockelhuber KW, Schulze HJ, Wenger A
Chemie Ingenieur Technik, 72(10), 1216, 2000
9 Analytical tools for the characterization of power devices
Schulze HJ, Frohnmeyer A, Niedernostheide FJ, Simmnacher B, Kolbesen BO, Tutto P, Pavelka T, Wachutka G
Journal of the Electrochemical Society, 147(10), 3879, 2000
10 Dimple relaxation in wetting films
Tsekov R, Letocart P, Schulze HJ
Langmuir, 16(21), 8206, 2000