검색결과 : 1건
No. | Article |
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Optical metrology of thick photoresist process for advanced 3D applications Nolot E, Andre A, Scibetta C, Poulingue M, Levin L, Vignoud L, Issele H Thin Solid Films, 571, 609, 2014 |
No. | Article |
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1 |
Optical metrology of thick photoresist process for advanced 3D applications Nolot E, Andre A, Scibetta C, Poulingue M, Levin L, Vignoud L, Issele H Thin Solid Films, 571, 609, 2014 |