화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Etching of Si through a thick condensed XeF2 layer
Sebel PGM, Hermans LJF, Beijerinck HCW
Journal of Vacuum Science & Technology A, 18(5), 2090, 2000
2 Reaction layer dynamics in ion-assisted Si/XeF2 etching: Temperature dependence
Sebel PGM, Hermans LJF, Beijerinck HCW
Journal of Vacuum Science & Technology A, 18(6), 2759, 2000
3 Study of the SiO2-to-Si3N4 etch selectivity mechanism in inductively coupled fluorocarbon plasmas and a comparison with the SiO2-to-Si mechanism
Schaepkens M, Standaert TEFM, Rueger NR, Sebel PGM, Oehrlein GS, Cook JM
Journal of Vacuum Science & Technology A, 17(1), 26, 1999
4 Silicon etch rate enhancement by traces of metal
Sebel PGM, Hermans LJF, Beijerinck HCW
Journal of Vacuum Science & Technology A, 17(3), 755, 1999
5 Reaction layer dynamics in ion-assisted Si/XeF2 etching: Ion flux dependence
Sebel PGM, Hermans LJF, Beijerinck HCW
Journal of Vacuum Science & Technology A, 17(6), 3368, 1999
6 High density fluorocarbon etching of silicon in an inductively coupled plasma : Mechanism of etching through a thick steady state fluorocarbon layer
Standaert TEFM, Schaepkens M, Rueger NR, Sebel PGM, Oehrlein GS, Cook JM
Journal of Vacuum Science & Technology A, 16(1), 239, 1998