검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry Drozdov MN, Drozdov YN, Csik A, Novikov AV, Vad K, Yunin PA, Yurasov DV, Belykh SF, Gololobov GP, Suvorov DV, Tolstogouzov A Thin Solid Films, 607, 25, 2016 |
| 2 |
Structural and magnetic properties of annealed FePt/Ag/FePt thin films Pavlova OP, Verbitska TI, Vladymyrskyi IA, Sidorenko SI, Katona GL, Beke DL, Beddies G, Albrecht M, Makogon IM Applied Surface Science, 266, 100, 2013 |
| 3 |
Grain boundary diffusion in thin films with a bimodal grain boundary structure Makovec A, Erdelyi G, Beke DL Thin Solid Films, 520(6), 2362, 2012 |
| 4 |
On the composition depth profile of electrodeposited Fe-Co-Ni alloys Peter L, Csik A, Vad K, Toth-Kadar E, Pekker A, Molnar G Electrochimica Acta, 55(16), 4734, 2010 |
| 5 |
State selective detection of sputtered Al neutrals by resonant laser ionization SNMS Hayashi S, Kubota N Applied Surface Science, 255(4), 834, 2008 |
| 6 |
Electrodeposition of Ni-Co-Cu/Cu multilayers - 2. Calculations of the element distribution and experimental depth profile analysis Peter L, Katona GL, Bernyi Z, Vad K, Langer GA, Toth-Kadar E, Padar J, Pogany L, Bakonyi I Electrochimica Acta, 53(2), 837, 2007 |
| 7 |
A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films Kothleitner G, Rogers M, Berendes A, Bock W, Kolbesen BO Applied Surface Science, 252(1), 66, 2005 |
| 8 |
A new horizon in secondary neutral mass spectrometry: post-ionization using a VUV free electron laser Veryovkin IV, Calaway WF, Moore JF, Pellin MJ, Lewellen JW, Li YL, Milton SV, King BV, Petravic M Applied Surface Science, 231-2, 962, 2004 |