검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition Ghumman CAA, Moutinho AMC, Santos A, Teodoro OMND, Tolstogouzov A Applied Surface Science, 258(7), 2490, 2012 |
| 2 |
Functionality of novel black silicon based nanostructured surfaces studied by TOF SIMS Talian I, Aranyosiova M, Orinak A, Velic D, Hasko D, Kaniansky D, Orinakova R, Hubner J Applied Surface Science, 256(7), 2147, 2010 |
| 3 |
Positive secondary ion yield enhancement of metal elements using trichlorotrifluoroethane and tetrachloroethene backfilling Chi PH, Gillen G Applied Surface Science, 231-2, 127, 2004 |