검색결과 : 9건
No. | Article |
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1 |
Photomodulated reflectance and transmittance: optical characterisation of novel semiconductor materials and device structures Misiewicz J, Sek G, Kudrawiec R, Sitarek P Thin Solid Films, 450(1), 14, 2004 |
2 |
Three beam photoreflectance as a powerful method to investigate semiconductor heterostructures Kudrawiec R, Sek G, Sitarek P, Ryczko K, Misiewicz J, Wang T, Forchel A Thin Solid Films, 450(1), 71, 2004 |
3 |
Photoreflectance spectroscopy of quantum dots Misiewicz J, Sek G, Ryczko K Current Applied Physics, 3(5), 417, 2003 |
4 |
Optical investigations of InGaAsN/GaAs single quantum well structures Sitarek P, Ryczko K, Sek G, Misiewicz J, Fischer M, Reinhardt M, Forchel A Solid-State Electronics, 47(3), 489, 2003 |
5 |
MOVPE technology and characterisation of silicon delta-doped GaAs and AlxGa1-xAs Sciana B, Radziewicz D, Paszkiewicz B, Tlaczala M, Utko M, Sitarek P, Sek G, Misiewicz J, Kinder R, Kovac J, Srnanek R Thin Solid Films, 412(1-2), 55, 2002 |
6 |
Photoreflectance spectroscopy of InGaAsN/GaAs quantum wells grown by MBE (vol 380, pg 240, 2000) Sek G, Ryczko K, Misiewicz J, Fischer M, Reinhardt M, Forchel A Thin Solid Films, 392(1), 150, 2001 |
7 |
Photoreflectance spectroscopy of InGaAsN/GaAs quantum wells grown by MB Sek G, Ryczko K, Misiewicz J, Fischer M, Reinhardt M, Forchel A Thin Solid Films, 380(1-2), 240, 2000 |
8 |
Photoreflectance study of delta-doped semiconductor layers by a fast Fourier transformation Nowaczyk M, Sek G, Misiewicz J, Sciana B, Radziewivz D, Tlaczala M Thin Solid Films, 380(1-2), 243, 2000 |
9 |
Photoreflectance spectroscopy of coupled InxGa1-xAs/GaAs quantum wells Sek G, Ryczko K, Kubisa M, Misiewicz J, Bayer M, Wang T, Koeth J, Forchel A Thin Solid Films, 364(1-2), 220, 2000 |