| 1 |
Selective area molecular beam epitaxy of InSb nanostructures on mismatched substrates
Desplanque L, Bucamp A, Troadec D, Patriarche G, Wallart X
Journal of Crystal Growth, 512, 6, 2019 |
| 2 |
Buffer free InGaAs quantum well and in-plane nanostructures on InP grown by atomic hydrogen assisted MBE
Bucamp A, Coinon C, Codron JL, Troadec D, Wallart X, Desplanque L
Journal of Crystal Growth, 512, 11, 2019 |
| 3 |
Characterization of high-quality relaxed flat InGaN template fabricated by combination of epitaxial lateral overgrowth and chemical mechanical polishing
Okada N, Inomata Y, Ikeuchi H, Fujimoto S, Itakura H, Nakashima S, Kawamura R, Tadatomo K
Journal of Crystal Growth, 512, 147, 2019 |
| 4 |
Atomic step-flow epitaxy of low defect InGaAs islands on Si(111) by micro-channel selective area MOVPE
Fu YF, Otake N, Tachino Y, Watanabe T, Sugiyama M
Journal of Crystal Growth, 507, 384, 2019 |
| 5 |
Fabrication of submicron active-region-buried GaN hexagonal frustum structures by selective area growth for directional micro-LEDs
Kumagai N, Takahashi T, Yamada H, Cong GW, Wang XL, Shimizu M
Journal of Crystal Growth, 507, 437, 2019 |
| 6 |
Vanishing biexciton binding energy from stacked, MOVPE grown, site-controlled pyramidal quantum dots for twin photon generation
Moroni ST, Varo S, Juska G, Chung TH, Gocalinska A, Pelucchi E
Journal of Crystal Growth, 506, 36, 2019 |
| 7 |
Growth and characterization of GaAs nanowires on Ge(111) substrates by selective-area MOVPE
Minami Y, Yoshida A, Motohisa J, Tomioka K
Journal of Crystal Growth, 506, 135, 2019 |
| 8 |
Cost-effective selective-area growth of GaN-based nanocolumns on silicon substrates by molecular-beam epitaxy
Zhao YK, Yang WX, Lu SL, Wu YY, Zhang X, Bian LF, Li XF, Tan M
Journal of Crystal Growth, 514, 124, 2019 |
| 9 |
Regrown source/drain in InGaAs multi-gate MOSFETs
Miyamoto Y, Kanazawad T, Kise N, Kinoshita H, Ohsawa K
Journal of Crystal Growth, 522, 11, 2019 |
| 10 |
Epitaxial relation of carbamazepine and its precursor template extracted from rotating grazing incidence X-ray diffraction
Riegler H, Rivalta A, Christian P, Rothel C, Salzillo T, Venuti E, Werzer O
Thin Solid Films, 683, 67, 2019 |
