검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Absolute scale reciprocal space mapping on X-ray diffractometers incorporating a position sensitive detector: Application to III-nitride semiconductors Franco N, Pereira S, Sequeira AD Materials Science Forum, 455-456, 132, 2004 |
| 2 |
Structural characterization and luminescence of Ge/Si quantum dots Fonseca A, Sobolev NA, Leitao JP, Carmo MC, Franco N, Presting H, Sequeira AD Materials Science Forum, 455-456, 540, 2004 |
| 3 |
Graded selective coatings based on chromium and titanium oxynitride Nunes C, Teixeira V, Prates ML, Barradas NP, Sequeira AD Thin Solid Films, 442(1-2), 173, 2003 |
| 4 |
High-temperature double-crystal X-ray diffractometer for in situ studies, the hotbird Sequeira AD, Franco N, Neves J Materials Science Forum, 378-3, 206, 2001 |
| 5 |
Software package for data acquisition and remote control of the high-temperature X-ray diffractometer, hotbird Franco N, Sequeira AD Materials Science Forum, 378-3, 212, 2001 |