1 |
Pressure Cycling for Purging of Dead Spaces in High-Purity Gas Delivery Systems Kishore J, Shadman F, Dittler R, Carl G AIChE Journal, 61(11), 3973, 2015 |
2 |
Computer modeling of surface interactions and contaminant transport in microstructures during the rinsing of patterned semiconductor wafers Dodge MR, Shadman F Computers & Chemical Engineering, 68, 182, 2014 |
3 |
Power industry restructuring and eco-efficiency changes: A new slacks-based model in Malmquist-Luenberger Index measurement Arabi B, Munisamy S, Emrouznejad A, Shadman F Energy Policy, 68, 132, 2014 |
4 |
Effect of Particle Size on the Adsorption and Desorption Properties of Oxide Nanoparticles Wang H, Shadman F AIChE Journal, 59(5), 1502, 2013 |
5 |
Removal of TiO2 nanoparticles by porous media: Effect of filtration media and water chemistry Rottman J, Platt LC, Sierra-Alvarez R, Shadman F Chemical Engineering Journal, 217, 212, 2013 |
6 |
Characterization of the surface properties of nanoparticles using moisture adsorption dynamic profiling Wang H, Yao JP, Shadman F Chemical Engineering Science, 66(12), 2545, 2011 |
7 |
Application of pressure-cycle purge (PCP) in dry-down of ultra-high-purity gas distribution systems Yao JP, Wang H, Dittler R, Geisert C, Shadman F Chemical Engineering Science, 65(17), 5041, 2010 |
8 |
Effect of Sampling Line Characteristics on the Dynamic Monitoring of Fluid Concentrations Juneja HS, Yao JP, Shadman F Industrial & Engineering Chemistry Research, 48(11), 5481, 2009 |
9 |
Moisture uptake and outgassing in patterned and capped porous low-k dielectric films Yao J, Iqbal A, Juneja H, Shadman F Journal of the Electrochemical Society, 154(10), G199, 2007 |
10 |
Removal of moisture contamination from porous polymeric low-k dielectric films Iqbal A, Juneja H, Yao JP, Shadman F AIChE Journal, 52(4), 1586, 2006 |