검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
In-situ FTIR-DRS investigation on shallow trap state of Cu-doped TiO2 photocatalyst Zhang LH, Han B, Cheng PF, Hu YH Catalysis Today, 341, 21, 2020 |
| 2 |
Degradation of 4H-SiC IGBT threshold characteristics due to SiC/SiO2 interface defects Pesic I, Navarro D, Miyake M, Miura-Mattausch M Solid-State Electronics, 101, 126, 2014 |