검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Effects of shallow trench isolation on low frequency noise characteristics of source-follower transistors in CMOS image sensors Kwon SK, Kwon HM, Choi WI, Song HS, Lee HD Solid-State Electronics, 119, 29, 2016 |
| 2 |
Investigation of consequent process-induced stress for N-type metal oxide semiconductor field effect transistor with a sunken shallow trench isolation pattern Lee CC, Liu CH, Deng RH, Hsu HW, Chiang KN Thin Solid Films, 557, 323, 2014 |
| 3 |
STI-to-gate distance effects on flicker noise characteristics in 0.13 mu m CMOS Chan CY, Huang YC, Chen JW, Hsu SSH, Juang YZ Solid-State Electronics, 52(8), 1182, 2008 |