화학공학소재연구정보센터
검색결과 : 5건
No. Article
1 Susceptibility of SiO2, ZrO2, and HfO2 dielectrics to moisture contamination
Raghu P, Yim C, Shadman F, Shero E
AIChE Journal, 50(8), 1881, 2004
2 Mechanistic study of surface contamination of dielectric oxides using isotope labeling
Raghu P, Yim C, Iqbal A, Shadman F, Shero E, Verghese M
Industrial & Engineering Chemistry Research, 43(12), 2977, 2004
3 Interactions of moisture and organic contaminants with SiO2 and ZrO2 gate dielectric films
Rana N, Raghu P, Shero E, Shadman F
Applied Surface Science, 205(1-4), 160, 2003
4 Adsorption of moisture and organic contaminants on hafnium oxide, zirconium oxide, and silicon oxide gate dielectrics
Raghu P, Rana N, Yim C, Shero E, Shadman F
Journal of the Electrochemical Society, 150(10), F186, 2003
5 The Equation of State of Polyamorphic Germania Glass - A 2-Domain Description of the Viscoelastic Response
Smith KH, Shero E, Chizmeshya A, Wolf GH
Journal of Chemical Physics, 102(17), 6851, 1995