검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Competition of Electromigration Reliability in Copper and Nickel-Silicide Cheng YL, Shiau MK, Chung WY, Wang YL Journal of the Electrochemical Society, 158(2), H174, 2011 |
| 2 |
Influence of temperature on the hydrogenated amorphous carbon films prepared by plasma-enhanced chemical vapor deposition Wu J, Cheng YL, Shiau MK Journal of Vacuum Science & Technology A, 28(6), 1363, 2010 |