검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Effects of dislocations on reliability of thermal oxides grown on n-type 4H-SiC wafer Senzaki J, Kojima K, Kato T, Shimozato A, Fukuda K Materials Science Forum, 483, 661, 2005 |
| No. | Article |
|---|---|
| 1 |
Effects of dislocations on reliability of thermal oxides grown on n-type 4H-SiC wafer Senzaki J, Kojima K, Kato T, Shimozato A, Fukuda K Materials Science Forum, 483, 661, 2005 |