검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Structural characterization of the grown crystal/seed interface of physical vapor transport grown 4H-SiC crystals using Raman microscopy and x-ray topography Shioura K, Shinagawa N, Izawa T, Ohtani N Journal of Crystal Growth, 515, 58, 2019 |
| 2 |
Structural characterization of the growth front of physical vapor transport grown 4H-SiC crystals using X-ray topography Sonoda M, Nakano T, Shioura K, Shinagawa N, Ohtani N Journal of Crystal Growth, 499, 24, 2018 |