검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Reductive Deposition of Thin Cu Films Using Ballistic Hot Electrons as a Printing Beam Suda R, Yagi M, Kojima A, Mori N, Shirakashi J, Koshida N Journal of the Electrochemical Society, 163(6), E162, 2016 |
| 2 |
A newly investigated approach for the control of tunnel resistance of nanogaps using field-emission-induced electromigration Takiya K, Tomoda Y, Kume W, Ueno S, Watanabe T, Shirakashi J Applied Surface Science, 258(6), 2029, 2012 |
| 3 |
Field-emission-induced electromigration method for the integration of single-electron transistors Ueno S, Tomoda Y, Kume W, Hanada M, Takiya K, Shirakashi J Applied Surface Science, 258(6), 2153, 2012 |
| 4 |
Scratch direction and threshold force in nanoscale scratching using atomic force microscopes Tseng AA, Kuo CFJ, Jou S, Nishimura S, Shirakashi J Applied Surface Science, 257(22), 9243, 2011 |
| 5 |
Scratch properties of nickel thin films using atomic force microscopy Tseng AA, Shirakashi J, Jou S, Huang JC, Chen TP Journal of Vacuum Science & Technology B, 28(1), 202, 2010 |
| 6 |
Control of channel resistance on metal nanowires by electromigration patterning method Takahashi K, Tomoda Y, Itami S, Shirakashi J Journal of Vacuum Science & Technology B, 27(2), 805, 2009 |
| 7 |
Fabrication of nanogap electrodes by field-emission-induced electromigration Tomoda Y, Takahashi K, Hanada M, Kume W, Shirakashi J Journal of Vacuum Science & Technology B, 27(2), 813, 2009 |
| 8 |
Improvement of scanning probe microscopy local oxidation nanolithography Nishimura S, Toyofuku T, Miyashita K, Takemura Y, Shirakashi J Journal of Vacuum Science & Technology B, 27(2), 948, 2009 |