검색결과 : 2건
No. | Article |
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1 |
Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal-metal interfaces Smith RJ, Ramana CV, Choi BS, Saleh AA, Shivaparan NR, Shutthanandan V Applied Surface Science, 219(1-2), 28, 2003 |
2 |
Molecular-Beam Epitaxial-Growth and Characterization of Mixed (Ti,Nb)O-2 Rutile Films on TiO2(100) Chambers SA, Gao Y, Thevuthasan S, Liang Y, Shivaparan NR, Smith RJ Journal of Vacuum Science & Technology A, 14(3), 1387, 1996 |