검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Development of multilayer oxidation resistant coatings on Cr-50Nb alloy Zheng HZ, Xiong LL, Luo QH, Lu SQ Applied Surface Science, 359, 515, 2015 |
| 2 |
Evaluation of the depth resolutions of Auger electron spectroscopic, X-ray photoelectron spectroscopic and time-of-flight secondary-ion mass spectrometric sputter depth profiling techniques Wang JY, Starke U, Mittemeijer EJ Thin Solid Films, 517(11), 3402, 2009 |
| 3 |
Depth dependences of the ion bombardment induced roughness and of the interdiffusion coefficient for Si/Al multilayers Wang JY, Zalar A, Mittemeijer EJ Applied Surface Science, 222(1-4), 171, 2004 |
| 4 |
Determination of the interdiffusion coefficient for Si/Al multilayers by Auger electron spectroscopical sputter depth profiling Wang JY, Zalar A, Zhao YH, Mittemeijer EJ Thin Solid Films, 433(1-2), 92, 2003 |