검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Effect of r.f. hydrogen plasma annealing on the properties Of Si/SiO2 interface: a spectroscopic ellipsometry study Paneva A, Szekeres A Thin Solid Films, 433(1-2), 367, 2003 |
| No. | Article |
|---|---|
| 1 |
Effect of r.f. hydrogen plasma annealing on the properties Of Si/SiO2 interface: a spectroscopic ellipsometry study Paneva A, Szekeres A Thin Solid Films, 433(1-2), 367, 2003 |