검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Facet engineering for SiGe/Si stressors in advanced CMOS technology Kasim J, Reichel C, Dilliway G, Bai B, Zakowsky N Solid-State Electronics, 110, 19, 2015 |
| 2 |
Migration of CrSi2 nanocrystals through nanopipes in the silicon cap Galkin NG, Dozsa L, Chusovitin EA, Pecz B, Dobos L Applied Surface Science, 256(23), 7331, 2010 |
| 3 |
Effects of Si-cap layer thinning and Ge segregation on the characteristics of Si/SiGe/Si heterostructure pMOSFETs Song YJ, Lim JW, Kim SH, Bae HC, Kang JY, Park KW, Shim KH Solid-State Electronics, 46(11), 1983, 2002 |