검색결과 : 19건
No. | Article |
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1 |
A model for predicting residual stiffness of unidirectional SiC/SiC composite under stress oxidation environment Xiong Y, Niu XM, Chen XH, Sun ZG, Li HY, Song YD Composite Interfaces, 27(8), 753, 2020 |
2 |
Wet oxidation behavior of SiC/(SiC- SiBCN)x composites prepared by CVI combined with PIOP process Luan XG, Xu XM, Zou Y, Wang L, Cheng LF, Riedel R Journal of the American Ceramic Society, 102(10), 6239, 2019 |
3 |
Effect of different parameters on machining of SiC/SiC composites via pico-second laser Li WN, Zhang RH, Liu YS, Wang CH, Wang J, Yang XJ, Cheng LF Applied Surface Science, 364, 378, 2016 |
4 |
Microstructure and joining strength evaluation of SiC/SiC joints brazed with SiCp/Ag-Cu-Ti hybrid tapes Liu Y, Qi Q, Zhu YZ, Zhang JX Journal of Adhesion Science and Technology, 29(15), 1563, 2015 |
5 |
[기획특집: 초고온 내열소재] 초고온 내열구조성 복합재료 윤병일 Korean Industrial Chemistry News, 17(4), 10, 2014 |
6 |
Growth of amorphous SiC film on Si by means of ion beam induced mixing Barna A, Gurban S, Kotis L, Labar J, Sulyok A, Toth AL, Menyhard M, Kovac J, Panjan P Applied Surface Science, 263, 367, 2012 |
7 |
LDMOS-transistors on semi-insulating silicon-on-polycrystalline-silicon carbide substrates for improved RF and thermal properties Lotfi S, Li LG, Vallin O, Vestling L, Norstrom H, Olsson J Solid-State Electronics, 70, 14, 2012 |
8 |
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies Brauer G, Anwand W, Eichhorn F, Skorupa W, Hofer C, Teichert C, Kuriplach J, Cizek J, Prochazka I, Coleman PG, Nozawa T, Kohyama A Applied Surface Science, 252(9), 3342, 2006 |
9 |
Simulation of fracture behavior of unidirectional SiC/SiC composite exposed in air at 823-1673 K Morishita K, Ochiai S, Okuda H, Nakayama H, Sato M Composite Interfaces, 12(8-9), 693, 2005 |
10 |
An attempt to recover strength of oxidized SiC/SiC composite by means of a deoxidation treatment Morishita K, Ochiai S, Okuda H, Nakayama H, Sato M Composite Interfaces, 12(8-9), 853, 2005 |