검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Raman and TEM characterization of high fluence C implanted nanometric Si on insulator dos Reis RMS, Maltez RL, Moreira EC, Dias YP, Boudinov H Applied Surface Science, 258(19), 7395, 2012 |
| No. | Article |
|---|---|
| 1 |
Raman and TEM characterization of high fluence C implanted nanometric Si on insulator dos Reis RMS, Maltez RL, Moreira EC, Dias YP, Boudinov H Applied Surface Science, 258(19), 7395, 2012 |