화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Chemical vapor deposition graphene of high mobility by gradient growth method on an 4H-SiC (0001) substrate
Liu QB, Yu C, He ZZ, Gu GD, Wang JJ, Zhou CJ, Guo JC, Gao XD, Feng ZH
Applied Surface Science, 454, 68, 2018
2 In-plane structural anisotropy and polarized Raman-active mode studies of nonpolar AlN grown on 6H-SiC by low-pressure hydride vapor phase epitaxy
Wu JJ, Okuura K, Okumura K, Miyake H, Hiramatsu K, Chen ZT, Egawa T
Journal of Crystal Growth, 312(4), 490, 2010
3 An internally-matched GaN HEMTs device with 45.2 W at 8 GHz for X-band application
Wang XL, Chen TS, Xiao HL, Tang J, Ran JX, Zhang ML, Feng C, Hou QF, Wei M, Jiang LJ, Li JM, Wang ZG
Solid-State Electronics, 53(3), 332, 2009
4 Determination of the average channel temperature of GaN MOSHFETs under continuous wave and periodic-pulsed RF operational conditions
Deng YQ, Islam MDM, Gaevski M, Yang ZJ, Adivarahan V, Khan A
Solid-State Electronics, 52(7), 1106, 2008
5 Cross-sectional spatially resolved cathodoluminescence study of cubic GaN films grown by metalorganic vapor phase epitaxy on free-standing (001) 3C-SiC and GaAs substrates
Onuma T, Nozaka T, Yamaguchi H, Suzuki T, Chichibu SF
Journal of Crystal Growth, 298, 193, 2007
6 Structural and optical characterization of GaN heteroepitaxial films on SiC substrates
Morse M, Wu P, Choi S, Kim TH, Brown AS, Losurdo M, Bruno G
Applied Surface Science, 253(1), 232, 2006
7 Improvement in light extraction efficiency in group III nitride-based light-emitting diodes using moth-eye structure
Iwaya M, Kasugai H, Kawashima T, Iida K, Honshio A, Miyake Y, Kamiyama S, Amano H, Akasaki I
Thin Solid Films, 515(2), 768, 2006
8 Seeded PVT growth of aluminum nitride on silicon carbide
Epelbaum BM, Bickermann M, Winnacker A
Materials Science Forum, 433-4, 983, 2002
9 Gaseous etching of 6H-SiC at relatively low temperatures
Xie ZY, Wei CH, Li LY, Yu QM, Edgar JH
Journal of Crystal Growth, 217(1-2), 115, 2000
10 Properties of transmission lines on various SiC substrates
Royet AS, Cabon B, Ouisse T, Billon T
Materials Science Forum, 338-3, 1267, 2000