| 1 |
Excess carrier lifetime mapping for bulk SiC wafers by microwave photoconductivity decay method and its relationship with structural defect distribution
Kato M, Ichimura M, Arai E, Sumie S, Hashizume H
Materials Science Forum, 457-460, 505, 2004 |
| 2 |
Nonequilibrium carrier lifetime and diffusion coefficients in 6H-SiC
Tamulaitis G, Yilmaz I, Shur MS, Gaska R, Anderson T
Materials Science Forum, 457-460, 665, 2004 |
| 3 |
Micropipe healing in liquid phase epitaxial growth of SiC
Yakimova R, Syvajarvi M, Rendakova S, Dimitriev VA, Henry A, Janzen E
Materials Science Forum, 338-3, 237, 2000 |
| 4 |
Highly Perfect Thin-Films of SiC - X-Ray Double-Crystal Diffractometry and X-Ray Double-Crystal Topographic Study
Chaudhuri J, Cheng X, Yuan C, Steckl AJ
Thin Solid Films, 292(1-2), 1, 1997 |
| 5 |
X-Ray Double-Crystal and X-Ray Topographic Characterization of Silicon-Carbide Thin-Films on Silicon, Titanium Carbide, 6H-Silicon Carbide, and Aluminum Nitride/Sapphire Substrates
Chaudhuri J, Thokala R, Edgar JH, Sywe BS
Thin Solid Films, 274(1-2), 23, 1996 |
