검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
A new way for measuring the apparent band gap narrowing in bipolar transistors Haiyan J, Lichun Z Solid-State Electronics, 44(12), 2233, 2000 |
| 2 |
Secondary-Ion Mass-Spectroscopy Ultrashallow Depth Profiling for Si/Si1-xGex/Si Heterojunction Bipolar-Transistors Kruger D, Kurps R, Heinemann B, Herzel F, Zeindl HP Journal of Vacuum Science & Technology B, 14(1), 287, 1996 |