검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterization of SiGeC thin films by MeV ion scattering and X-ray diffraction Nagaki M, Narusawa T, Hiraki A, Saitoh T, Kubo M Thin Solid Films, 369(1-2), 143, 2000 |
| No. | Article |
|---|---|
| 1 |
Characterization of SiGeC thin films by MeV ion scattering and X-ray diffraction Nagaki M, Narusawa T, Hiraki A, Saitoh T, Kubo M Thin Solid Films, 369(1-2), 143, 2000 |