검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Statistical analysis of tunnel currents in scaled MOS structures with a non-uniform oxide thickness distribution Tyaginov SE, Vexler MI, Shulekin AF, Grekhov IV Solid-State Electronics, 49(7), 1192, 2005 |
| No. | Article |
|---|---|
| 1 |
Statistical analysis of tunnel currents in scaled MOS structures with a non-uniform oxide thickness distribution Tyaginov SE, Vexler MI, Shulekin AF, Grekhov IV Solid-State Electronics, 49(7), 1192, 2005 |