검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Conditioning of Si-interfaces by wet-chemical oxidation: Electronic interface properties study by surface photovoltage measurements Angermann H Applied Surface Science, 312, 3, 2014 |
| 2 |
Real-space insight in the nanometer scale roughness development during growth and ion beam polishing of molybdenum silicon multilayer films Zoethout E, Louis E, Bijkerk F Applied Surface Science, 285, 293, 2013 |
| 3 |
Self-affinity study of nanostructured porous silicon-crystalline silicon interfaces Escorcia-Garcia J, Cruz-Silva R, Agarwal V Applied Surface Science, 256(3), 645, 2009 |
| 4 |
Buried interface characterization by interference microscopy Benatmane A, Montgomery PC Thin Solid Films, 450(1), 187, 2004 |
| 5 |
Imaging Extrinsic Defects at the Nisi2/Si(111) Metal-Semiconductor Interface Kubby JA, Greene WJ Journal of Vacuum Science & Technology A, 12(4), 2009, 1994 |