| 1 |
Experimental DC extraction of the thermal resistance of bipolar transistors taking into account the Early effect
d'Alessandro V
Solid-State Electronics, 127, 5, 2017 |
| 2 |
Study of high-temperature Smart Cut (TM): Application to silicon-on-sapphire films and to thin foils of single crystal silicon
Meyer R, Kononchuck O, Moriceau H, Lemiti M, Bruel M
Solid-State Electronics, 115, 225, 2016 |
| 3 |
Polycrystalline silicon films on glass grown by amorphous-liquid-crystalline transition at temperatures below 330 degrees C
Heimburger R, Dessmann N, Teubner T, Schramm HP, Boeck T, Fornari R
Thin Solid Films, 520(6), 1784, 2012 |
| 4 |
High performance pMOS circuits with silicon-on-glass TFTs
Kim JI, Choi JW, Choi W, Mativenga M, Jang J, Williams CK, Wang CC, Mozdy E, Cites J, Lai J, Tredwell TJ
Solid-State Electronics, 54(3), 299, 2010 |
| 5 |
Influence of layout design and on-wafer heatspreaders on the thermal behavior of fully-isolated bipolar transistors: Part I - Static analysis
Russo S, La Spina L, d'Alessandro V, Rinaldi N, Nanver LK
Solid-State Electronics, 54(8), 745, 2010 |
| 6 |
Influence of layout design and on-wafer heatspreaders on the thermal behavior of fully-isolated bipolar transistors: Part II - Dynamic analysis
Russo S, La Spina L, d'Alessandro V, Rinaldi N, Nanver LK
Solid-State Electronics, 54(8), 754, 2010 |
| 7 |
Cross-talk suppression in SOI substrates
Baine P, Jin M, Gamble HS, Armstrong BM, Linton D, Mohammed F
Solid-State Electronics, 49(9), 1461, 2005 |
| 8 |
A novel route to a polycrystalline silicon thin-film solar cell
Fuhs W, Gall S, Rau B, Schmidt M, Schneider J
Solar Energy, 77(6), 961, 2004 |
| 9 |
Experimental and numerical analysis of surface melt dynamics in 200 ns-excimer laser crystallization of a-Si films on glass
Fogarassy E, de Unamuno S, Prevot B, Harrer T, Maresch S
Thin Solid Films, 383(1-2), 48, 2001 |
| 10 |
Correlated structural and electronic properties of microcrystalline silicon films deposited at low temperature by catalytic CVD
Bouree JE
Thin Solid Films, 395(1-2), 157, 2001 |
