검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Dopant Depth Profiling by Anodic Sectioning Using 0.1 M HCl Electrolyte Bardwell JA, Evans RJ, Draper N, Rolfe SJ, Naem A, Simardnormandin M Journal of the Electrochemical Society, 143(11), L256, 1996 |
| 2 |
2-Dimensional Delineation of Semiconductor Doping by Scanning Resistance Microscopy Shafai C, Thomson DJ, Simardnormandin M Journal of Vacuum Science & Technology B, 12(1), 378, 1994 |