검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
Control of etch depth in patterned semiconductor substrates using real time spectroscopic ellipsometry Cho SJ, Snyder PG, Ianno NJ, Herzinger CM, Johs B Thin Solid Films, 455-56, 645, 2004 |
| 2 |
Etch depth control in bulk GaAs using patterning and real time spectroscopic ellipsometry Cho SJ, Snyder PG, Herzinger CM, Johs B Journal of Vacuum Science & Technology B, 20(1), 197, 2002 |
| 3 |
Spectroscopic analysis of photochromic films Mo YG, Dillon RO, Snyder PG Journal of Vacuum Science & Technology A, 17(1), 170, 1999 |
| 4 |
Visible and infrared photochromic properties of amorphous WO3-x films Mo YG, Dillon RO, Snyder PG Journal of Vacuum Science & Technology A, 17(5), 2933, 1999 |
| 5 |
Real time monitoring and control of wet etching of GaAs/Al0.3Ga0.7As using real time spectroscopic ellipsometry Cho SJ, Snyder PG Journal of Vacuum Science & Technology B, 17(5), 2045, 1999 |
| 6 |
Optical properties of photochromic organic-inorganic composites Mo YG, Dillon RO, Snyder PG, Tiwald TE Thin Solid Films, 355-356, 1, 1999 |
| 7 |
Investigation of citric acid hydrogen peroxide etched GaAs and Al0.3Ga0.7As surfaces by spectroscopic ellipsometry Snyder PG, Cho SJ Journal of Vacuum Science & Technology B, 16(5), 2680, 1998 |
| 8 |
Infrared free carrier response of In0.15Ga0.85As0.17Sb0.83 epilayers on GaSb Snyder PG, Tiwald TE, Thompson DW, Ianno NJ, Woollam JA, Mauk MG, Shellenbarger ZA Thin Solid Films, 313-314, 667, 1998 |
| 9 |
Is Your Plant Inherently Safer Snyder PG Hydrocarbon Processing, 75(7), 77, 1996 |
| 10 |
Spectroscopic Ellipsometric Monitoring of Electron-Cyclotron-Resonance Plasma-Etching of GaAs and AlGaAs Snyder PG, Ianno NJ, Wigert B, Pittal S, Johs B, Woollam JA Journal of Vacuum Science & Technology B, 13(6), 2255, 1995 |