검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
Chemical and morphological modifications of single layer graphene submitted to annealing in water vapor Rolim GK, Correa SA, Galves LA, Lopes JMJ, Soares GV, Radtke C Applied Surface Science, 427, 825, 2018 |
| 2 |
Washing-resistant surfactant coated surface is able to inhibit pathogenic bacteria adhesion Treter J, Bonatto F, Krug C, Soares GV, Baumvol IJR, Macedo AJ Applied Surface Science, 303, 147, 2014 |
| 3 |
Evolution of the Al2O3/Ge(100) interface for reactively sputter-deposited films submitted to postdeposition anneals Bom NM, Soares GV, Krug C, Pezzi RP, Baumvol IJR, Radtke C Applied Surface Science, 258(15), 5707, 2012 |
| 4 |
Effect of Reoxidations and Thermal Treatments with Hydrogen Peroxide in the SiO2/SiC Interfacial Region Pitthan E, Correa SA, Palmieri R, Soares GV, Boudinov HI, Stedile FC Electrochemical and Solid State Letters, 14(9), H368, 2011 |
| 5 |
Physicochemical and Electrical Properties of LaLuO3/Ge(100) Structures Submitted to Postdeposition Annealings Radtke C, Krug C, Soares GV, Baumvol IJR, Lopes JMJ, Durgun-Ozben E, Nichau A, Schubert J, Mantl S Electrochemical and Solid State Letters, 13(5), G37, 2010 |
| 6 |
H Quantification and Profiling in SiO2/SiC Submitted to Annealing in Water Vapor Soares GV, Baumvol IJR, Correa SA, Radtke C, Stedile FC Electrochemical and Solid State Letters, 13(11), G95, 2010 |
| 7 |
Physicochemical and structural characteristics of TiC and VC thin films deposited by DC reactive magnetron sputtering Aguzzoli C, Figueroa CA, Soares GV, Baumvol IJR Journal of Materials Science, 45(18), 4994, 2010 |
| 8 |
Deuterium Trapping at the Pt/HfO2 Interface Driemeier C, Kanter MM, Miotti L, Soares GV, Baumvol IJR Electrochemical and Solid State Letters, 12(4), G9, 2009 |
| 9 |
Carbon occupancy of interstitial sites in vanadium carbide films deposited by direct current reactive magnetron sputtering Portolan E, Amorim CLG, Soares GV, Aguzzoli C, Perottoni CA, Baumvol IJR, Figueroa CA Thin Solid Films, 517(24), 6493, 2009 |
| 10 |
Presence and resistance to wet etching of silicon oxycarbides at the SiO2/SiC interface Correa SA, Radtke C, Soares GV, Baumvol IJR, Krug C, Stedile FC Electrochemical and Solid State Letters, 11(9), H258, 2008 |