검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Quantitative fundamental SIMS studies using O-18 implant standards Williams P, Sobers RC, Franzreb K, Lorincik J Applied Surface Science, 252(19), 6429, 2006 |
| 2 |
Detection of the diatomic dications SiH2+ and AM(2+) Franzreb K, Sobers RC, Lorincik J, Williams P Applied Surface Science, 231-2, 82, 2004 |
| 3 |
Quantitative measurement of O/Si ratios in oxygen- sputtered silicon using O-18 implant standards Sobers RC, Franzreb K, Williams P Applied Surface Science, 231-2, 729, 2004 |
| 4 |
Formation of doubly positively charged diatomic ions of Mo-2(2+) produced by Ar+ sputtering of an Mo metal surface Franzreb K, Sobers RC, Lorincik J, Williams P Journal of Chemical Physics, 120(17), 7983, 2004 |
| 5 |
Gas-phase diatomic trications of Se-2(3+), Te-2(3+), and LaF3+ Franzreb K, Hrusak J, Alikhani ME, Lorincik J, Sobers RC, Williams P Journal of Chemical Physics, 121(24), 12293, 2004 |