검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterization of interface traps in the subthreshold region of implanted 4H and 6H-SiC MOSFETs Zeng Y, Softic A, White MH Solid-State Electronics, 46(10), 1579, 2002 |
| No. | Article |
|---|---|
| 1 |
Characterization of interface traps in the subthreshold region of implanted 4H and 6H-SiC MOSFETs Zeng Y, Softic A, White MH Solid-State Electronics, 46(10), 1579, 2002 |