검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Z-scan analysis of elliptical Gaussian beams in Kerr media through the variational method: Toward integrative analytic solutions of Z-scan Lee SJ, Kim GH, Mun YH, Sohn CW, Hong KH, Kim HD, Kim JS, Kwak CH Current Applied Physics, 17(2), 290, 2017 |
| 2 |
Investigation of the electrical and optical properties of InAs/InGaAs dot in a well solar cell Lee SH, Han IS, Sohn CW, Jo HJ, Kim JS, Lee SJ, Noh SK, Kim JO Current Applied Physics, 15(11), 1318, 2015 |
| 3 |
Investigation of process-induced performance variability and optimization of the 10 nm technology node Si bulk FinFETs Baek RH, Kang CY, Sohn CW, Kim DM, Kirsch P Solid-State Electronics, 96, 27, 2014 |
| 4 |
Electrical characteristics of 20-nm junctionless Si nanowire transistors Park CH, Ko MD, Kim KH, Baek RH, Sohn CW, Baek CK, Park S, Deen MJ, Jeong YH, Lee JS Solid-State Electronics, 73, 7, 2012 |
| 5 |
Some characteristics of materials surface-modified by ions beam bombardment Park JW, Sohn CW, Choi BH Current Applied Physics, 6(2), 188, 2006 |