검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Dielectric thickness dependence of capacitive behavior in graphene deposited on silicon dioxide Sonde S, Giannazzo F, Raineri V, Rimini E Journal of Vacuum Science & Technology B, 27(2), 868, 2009 |
| 2 |
Processing factors impacting the leakage current and flicker noise of germanium p(+)-n junctions on silicon substrates Simoen E, Sonde S, Claeys C, Satta A, De Jaeger B, Todi R, Meuris M Journal of the Electrochemical Society, 155(3), H145, 2008 |