검색결과 : 5건
No. | Article |
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1 |
Relations between the optical properties and the microstructure of TiO2 thin films prepared by ion-assisted deposition Leprince-Wang Y, Souche D, Yu-Zhang K, Fisson S, Vuye G, Rivory J Thin Solid Films, 359(2), 171, 2000 |
2 |
Microstructural characterization of ion assisted SiO2 thin films by visible and infrared ellipsometry Brunet-Bruneau A, Souche D, Fisson S, Van VN, Vuye G, Abeles F, Rivory J Journal of Vacuum Science & Technology A, 16(4), 2281, 1998 |
3 |
Visible and infrared ellipsometry study of ion assisted SiO2 films Souche D, Brunet-Bruneau A, Fisson S, Van VN, Vuye G, Abeles F, Rivory J Thin Solid Films, 313-314, 676, 1998 |
4 |
Correlation between microstructure and the optical properties of TiO2 thin films prepared on different substrates Leprince-Wang Y, Yu-Zhang K, Van VN, Souche D, Rivory J Thin Solid Films, 307(1-2), 38, 1997 |
5 |
Initial-Stages in the Formation of PtSi on Si(111) as Followed by Photoemission and Spectroscopic Ellipsometry Ley L, Wang Y, Van VN, Fisson S, Souche D, Vuye G, Rivory J Thin Solid Films, 270(1-2), 561, 1995 |