검색결과 : 1건
No. | Article |
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1 |
Characterization of SiC in DLC/a-Si films prepared by pulsed filtered cathodic arc using Raman spectroscopy and XPS Srisang C, Asanithi P, Siangchaew K, Pokaipisit A, Limsuwan P Applied Surface Science, 258(15), 5605, 2012 |