검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Electrostatic Coupling and Identification of Single-Defects in GaN/AlGaN Fin-MIS-HEMTs Grill A, Stampfer B, Im KS, Lee JH, Ostermaier C, Ceric H, Waltl M, Grasser T Solid-State Electronics, 156, 41, 2019 |
| No. | Article |
|---|---|
| 1 |
Electrostatic Coupling and Identification of Single-Defects in GaN/AlGaN Fin-MIS-HEMTs Grill A, Stampfer B, Im KS, Lee JH, Ostermaier C, Ceric H, Waltl M, Grasser T Solid-State Electronics, 156, 41, 2019 |