| 1 |
Curvature radius measurement by optical profiler and determination of the residual stress in thin films
Besnard A, Ardigo MR, Imhoff L, Jacquet P
Applied Surface Science, 487, 356, 2019 |
| 2 |
Examining the validity of Stoney-equation for in-situ stress measurements in thin film electrodes using a large-deformation finite-element procedure
Wen JC, Wei YJ, Cheng YT
Journal of Power Sources, 387, 126, 2018 |
| 3 |
Extending Stoney's equation to thin, elastically anisotropic substrates and bilayer films
Injeti SS, Annabattula RK
Thin Solid Films, 598, 252, 2016 |
| 4 |
Overview and applicability of residual stress estimation of film-substrate structure
Chou TL, Yang SY, Chiang KN
Thin Solid Films, 519(22), 7883, 2011 |
| 5 |
Bending of silicon plate crystals through superficial grooving: Modeling and experimentation
Bellucci V, Camattari R, Guidi V, Mazzolari A
Thin Solid Films, 520(3), 1069, 2011 |
| 6 |
Stoney equation limits for samples deformed as a cylindrical surface
Pureza JM, Neri F, Lacerda MM
Applied Surface Science, 256(13), 4408, 2010 |
| 7 |
Enhancing accuracy to Stoney equation
Pureza JM, Lacerda MM, De Oliveira AL, Fragalli JF, Zanon RAS
Applied Surface Science, 255(12), 6426, 2009 |
| 8 |
Celebrating the 100th anniversary of the Stoney equation for film stress: Developments from polycrystalline steel strips to single crystal silicon wafers
Janssen GCAM, Abdalla MM, van Keulen F, Pujada BR, van Venrooy B
Thin Solid Films, 517(6), 1858, 2009 |
| 9 |
On the electrochemical applications of the bending beam method
Lang GG, Seo M
Journal of Electroanalytical Chemistry, 490(1-2), 98, 2000 |
