검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Fully subthreshold current-based characterization of interface traps and surface potential in III-V-on-insulator MOSFETs Kim SK, Lee J, Geum DM, Park MS, Choi WJ, Choi SJ, Kim DH, Kim S, Kim DM Solid-State Electronics, 122, 8, 2016 |