검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Scanning proximal probes for parallel imaging and lithography Ivanova K, Sarov Y, Ivanov T, Frank A, Zollner J, Bitterlich C, Wenzel U, Volland BE, Klett S, Rangelow IW, Zawierucha P, Zielony M, Gotszalk T, Dontzov D, Schott W, Nikolov N, Zier M, Schmidt B, Engl W, Sulzbach T, Kostic I Journal of Vacuum Science & Technology B, 26(6), 2367, 2008 |
| 2 |
Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams Lehrer C, Frey L, Petersen S, Ryssel H, Schafer M, Sulzbach T Journal of Vacuum Science & Technology B, 22(3), 1402, 2004 |
| 3 |
Improvements of the lateral resolution of the MFM technique Koblischka MR, Hartmann U, Sulzbach T Thin Solid Films, 428(1-2), 93, 2003 |
| 4 |
Evaluating probes for "electrical" atomic force microscopy Trenkler T, Hantschel T, Stephenson R, De Wolf P, Vandervorst W, Hellemans L, Malave A, Buchel D, Oesterschulze E, Kulisch W, Niedermann P, Sulzbach T, Ohlsson O Journal of Vacuum Science & Technology B, 18(1), 418, 2000 |