검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Lifetime mapping technique for ultrathin silicon-on-insulator wafers Sumie S, Ojima F, Yamashita K, Iba K, Hashizume H Journal of the Electrochemical Society, 152(1), G99, 2005 |
| 2 |
Excess carrier lifetime mapping for bulk SiC wafers by microwave photoconductivity decay method and its relationship with structural defect distribution Kato M, Ichimura M, Arai E, Sumie S, Hashizume H Materials Science Forum, 457-460, 505, 2004 |