1 |
Effect of high-k and vacuum dielectrics as gate stack on a junctionless cylindrical surrounding gate (JL-CSG) MOSFET Sharma A, Jain A, Pratap Y, Gupta RS Solid-State Electronics, 123, 26, 2016 |
2 |
Analytical model of drain current of cylindrical surrounding gate p-n-i-n TFET Xu WJ, Wong H, Iwai H Solid-State Electronics, 111, 171, 2015 |
3 |
Compact model for long-channel cylindrical surrounding-gate MOSFETs valid from low to high doping concentrations Cheralathan M, Cerdeira A, Iniguez B Solid-State Electronics, 55(1), 13, 2011 |
4 |
A charge-based compact model for predicting the current-voltage and capacitance-voltage characteristics of heavily doped cylindrical surrounding-gate MOSFETs Liu FL, Zhang J, He F, Liu F, Zhang LN, Chan MS Solid-State Electronics, 53(1), 49, 2009 |
5 |
An analytic model for threshold voltage shift due to quantum confinement in surrounding gate MOSFETs with anisotropic effective mass Yuan Y, Yu B, Song J, Taur Y Solid-State Electronics, 53(2), 140, 2009 |
6 |
A new compact subthreshold behavior model for dual-material surrounding gate (DMSG) MOSFETs Chiang TK Solid-State Electronics, 53(5), 490, 2009 |
7 |
Symmetric linearization method for double-gate and surrounding-gate MOSFET models Dessai G, Dey A, Gildenblat G, Smit GDJ Solid-State Electronics, 53(5), 548, 2009 |
8 |
A unified charge model for symmetric double-gate and surrounding-gate MOSFETs Lu HX, Yu B, Taur Y Solid-State Electronics, 52(1), 67, 2008 |
9 |
An analytical threshold voltage model for graded channel asymmetric gate stack (GCASYMGAS) surrounding gate MOSFET Kaur H, Kabra S, Haldar S, Gupta RS Solid-State Electronics, 52(2), 305, 2008 |
10 |
Impact of graded channel (GC) design in fully depleted cylindrical/surrounding gate MOSFET (FD CGT/SGT) for improved short channel immunity and hot carrier reliability Kaur H, Kabra S, Bindra S, Haldar S, Gupta RS Solid-State Electronics, 51(3), 398, 2007 |