화학공학소재연구정보센터
검색결과 : 13건
No. Article
1 Fabrication of high-aspect ratio silicon nanopillars and nanocones using deep reactive ion etching
Fischer C, Menezes JW, Moshkalev SA, Verissimo C, Vaz AR, Swart JW
Journal of Vacuum Science & Technology B, 27(6), 2732, 2009
2 Platinum thin films deposited on silicon oxide by focused ion beam: characterization and application
Vaz AR, da Silva MM, Leon J, Moshkalev SA, Swart JW
Journal of Materials Science, 43(10), 3429, 2008
3 Structural and surface properties of Si1-xGex thin films obtained by reduced pressure CVD
Teixeira RC, Doi I, Diniz JA, Swart JW, Zakia MBP
Applied Surface Science, 254(1), 207, 2007
4 Fabrication and characterization of Ge nanocrystalline growth by ion implantation in SiO2 matrix
Mestanza SNM, Doi I, Swart JW, Frateschi NC
Journal of Materials Science, 42(18), 7757, 2007
5 Characterization and modeling of antireflective coatings of SiO2, Si3N4, and SiOxNy deposited by electron cyclotron resonance enhanced plasma chemical vapor deposition
Mestanza SNM, Obrador MP, Rodriguez E, Biasotto C, Doi I, Diniz JA, Swart JW
Journal of Vacuum Science & Technology B, 24(2), 823, 2006
6 Efficacy of ECR-CVD silicon nitride passivation in InGaP/GaAs HBTs
Zoccal LB, Diniz JA, Doi I, Swart JW, Daltrini AM, Moshkalyov SA
Journal of Vacuum Science & Technology B, 24(4), 1762, 2006
7 X-ray multiple diffraction on the shallow junction of B in Si(001)
Orloski RV, Pudenzi MAA, Hayashi MA, Swart JW, Cardoso LP
Journal of Molecular Catalysis A-Chemical, 228(1-2), 177, 2005
8 Mechanisms of silicon nitride etching by electron cyclotron resonance plasmas using SF6- and NF3-based gas mixtures
Reyes-Betanzo C, Moshkalyov SA, Ramos ACS, Swart JW
Journal of Vacuum Science & Technology A, 22(4), 1513, 2004
9 Silicon nitride deposited by ECR-CVD at room temperature for LOCOS isolation technology
Pereira MA, Diniz JA, Doi I, Swart JW
Applied Surface Science, 212, 388, 2003
10 Silicon nitride etching in high- and low-density plasmas using SF6/O-2/N-2 mixtures
Reyes-Betanzo C, Mohshkalyov SA, Swart JW, Ramos ACS
Journal of Vacuum Science & Technology A, 21(2), 461, 2003