검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Preparation of Atomically Smooth Aluminum Films - Characterization by Transmission Electron-Microscopy and Atomic-Force Microscopy Higo M, Lu X, Mazur U, Hipps KW Langmuir, 13(23), 6176, 1997 |
| 2 |
Silicon Structures for in-Situ Characterization of Atomic-Force Microscope Probe Geometry Jarausch KF, Stark TJ, Russell PE Journal of Vacuum Science & Technology B, 14(6), 3425, 1996 |
| 3 |
Dendrimer-Modified Silicon-Oxide Surfaces as Platforms for the Deposition of Gold and Silver Colloid Monolayers - Preparation Method, Characterization, and Correlation Between Microstructure and Optical-Properties Bar G, Rubin S, Cutts RW, Taylor TN, Zawodzinski TA Langmuir, 12(5), 1172, 1996 |
| 4 |
Resolution Enhanced Scanning Force Microscopy Measurements for Characterizing Dry-Etching Methods Applied to Titanium Masked InP Gortz W, Kempf B, Kretz J Journal of Vacuum Science & Technology B, 13(1), 34, 1995 |