검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Atomic force microscopy correlated with spectroscopic ellipsometry during homepitaxial growth on GaAs(111)B substrates Tomich DH, Eyink KG, Seaford ML, Taferner WF, Tu CW, Lampert WV Journal of Vacuum Science & Technology B, 16(3), 1479, 1998 |